Bias Temperature Instability for Devices and Circuits
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, an...
Guardado en:
| Otros Autores: | |
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| Formato: | Libro electrónico |
| Lenguaje: | Inglés |
| Publicado: |
New York, NY :
Springer New York : Imprint: Springer,
2014.
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| Materias: | |
| Acceso en línea: | http://dx.doi.org/10.1007/978-1-4614-7909-3 |
| Aporte de: | Registro referencial: Solicitar el recurso aquí |
Tabla de Contenidos:
- Introduction
- Characterization, Experimental Challenges
- Advanced Characterization
- Characterization of Nanoscale Devices
- Statistical Properties/Variability
- Theoretical Understanding
- Possible Defects: Experimental
- Possible Defects: First Principles
- Modeling
- Technological Impact
- Silicon dioxides/SiON
- High-k oxides
- Alternative technologies
- Circuits.