Bias Temperature Instability for Devices and Circuits

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability.  Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, an...

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Detalles Bibliográficos
Otros Autores: Grasser, Tibor (ed.)
Formato: Libro electrónico
Lenguaje:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2014.
Materias:
Engineering.
Semiconductors.
Quality control.
Reliability.
Industrial safety.
Electronics.
Microelectronics.
Electronic circuits.
Circuits and Systems.
Instrumentation.
Risk.
Acceso en línea:http://dx.doi.org/10.1007/978-1-4614-7909-3
Aporte de:Registro referencial: Solicitar el recurso aquí
Bibliotecas (ING-UNLP) de Universidad Nacional de La Plata

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