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Titulos:
Random testing of digital circuits: theory and application / René David
Idiomas:
eng
ISBN:
0824701828
Lugar de Edición:
Nueva York:
Editor:
Marcel Dekker,
Fecha de Edición:
c1998
Notas Formateada:
1.Random testing and built-in self-test -- 2.Models for digital circuits and fault models -- 3.Basic concepts and test generation methods -- 4.Performance measurements for a test sequence -- 5.Basic principles of random testing -- 6.Random test length for combinational circuits -- 7.Random test length for sequential circuits -- 8.Random test length for RAMs -- 9.Random test length for microprocessors -- 10.Generation of random test sequences -- 11.Experimental results -- 12.Signature analysis -- 13.Design for random testability
Palabras clave:
CIRCUITOS INTEGRADOS DIGITALES; ENSAYO

Leader:
cam
Campo 003:
AR-BaIT
Campo 008:
270401t1988t xxu|||||||||||||||||eng||
Campo 020:
^a0824701828
Campo 040:
^aITBA^cITBA
Campo 041:
0 ^aeng
Campo 100:
1 ^aDavid, René^95010
Campo 245:
10^aRandom testing of digital circuits:^btheory and application /^cRené David
Campo 246:
Campo 260:
^aNueva York:^bMarcel Dekker,^cc1998
Campo 300:
^axix, 475 p.
Campo 505:
0 ^a1.Random testing and built-in self-test -- 2.Models for digital circuits and fault models -- 3.Basic concepts and test generation methods -- 4.Performance measurements for a test sequence -- 5.Basic principles of random testing -- 6.Random test length for combinational circuits -- 7.Random test length for sequential circuits -- 8.Random test length for RAMs -- 9.Random test length for microprocessors -- 10.Generation of random test sequences -- 11.Experimental results -- 12.Signature analysis -- 13.Design for random testability
Campo 650:
4^918453^aCIRCUITOS INTEGRADOS DIGITALES
Campo 650:
4^9513^aENSAYO
Proveniencia:
^aInstituto Tecnológico Buenos Aires (ITBA) - Biblioteca
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Institucion:
Instituto Tecnológico Buenos Aires (ITBA)
Dependencia:
Biblioteca

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