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Titulos:
New horizons in testing : latent trait test theory and computerized adaptive testing / edited by David J. Weiss ; contributors, R. Darrell Bock ... [et al.].
ISBN:
0127427805 (alk. paper)
Lugar de Edición:
New York :
Editor:
Academic Press,
Fecha de Edición:
1983.
Notas #:
Derived from the 1979 Computerized Adaptive Testing Conference held at Wayzata, Minn., sponsored by the U.S. Office of Naval Research, et al.
Palabras clave:
Computer adaptive testing.; PRUEBAS MENTALES; PSICOMETRIA; Psychological Tests; Psychological tests

Leader:
cam
Campo 003:
OCoLC
Campo 008:
821214s1983 nyua b 101 0 eng
Campo 020:
^a0127427805 (alk. paper)
Campo 245:
00^aNew horizons in testing :^blatent trait test theory and computerized adaptive testing /^cedited by David J. Weiss ; contributors, R. Darrell Bock ... [et al.].
Campo 246:
Campo 260:
^aNew York :^bAcademic Press,^c1983.
Campo 300:
^axvii, 345 p. :^bill. ;^c24 cm.
Campo 500:
^aDerived from the 1979 Computerized Adaptive Testing Conference held at Wayzata, Minn., sponsored by the U.S. Office of Naval Research, et al.
Campo 650:
0^aComputer adaptive testing.
Campo 650:
4^aPRUEBAS MENTALES
Campo 650:
4^aPSICOMETRIA
Campo 650:
2^aPsychological Tests^vcongresses.
Campo 650:
0^aPsychological tests^vCongresses.
Campo 700:
1 ^aWeiss, David J.
Campo 700:
1 ^aBock, R. Darrell.
Campo 710:
1 ^aUnited States.^bOffice of Naval Research.
Campo 711:
2 ^aComputerized Adaptive Testing Conference^d(1979 :^cWayzata, Minn.)
Proveniencia:
^aUnRioCuarto
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Institucion:
Base de Datos MARC21 - OCLC
Dependencia:
BDUMARC21

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