Usted se encuentra revisando un registro bibliográfico de la BDU Para conocer mas sobre la Base de Datos Unificada haga click en el ícono del home

Titulos:
Ion spectroscopies for surface analysis / edited by A.W. Czanderna and David M. Hercules.
ISBN:
0306437929
Lugar de Edición:
New York :
Editor:
Plenum Press,
Fecha de Edición:
c1991.
Notas #:
References. Appendix. Index
Notas Formateada:
Overview of ion spectroscopies for surface compositional analysis / A.W. Czanderna -- Surface structure and reaction studies by ion-solid collisions / Nicholas Winograd and Barbara J. Garrison -- Particle-induced desorption ionization techniques for organic mass spectrometry / Kenneth L. Busch -- Laser resonant and nonresonant photoionization of sputtered neutrals / Christopher H. Becker -- Rutherford backscattering and nuclear reaction analysis / L.C. Feldman -- Ion scattering spectroscopy / E. Taglauer -- Comparisons of SIMS, SNMS, ISS, RBS, AES, and XPS methods for surface compositional analysis / C.J. Powell, D.M. Hercules, and A.W. Czanderna.
Palabras clave:
ESPECTROSCOPIA, EXITACION; SECONDARY ION MAS SPECTROMETRY; Secondary ion mass spectrometry.; Solids; SOLIDS SURFACES ANALYSIS; SURFACE CHEMISTRY; Surface chemistry.

Leader:
pam
Campo 003:
OCoLC
Campo 008:
910507s1991 nyua b 001 0 eng
Campo 020:
^a0306437929
Campo 245:
00^aIon spectroscopies for surface analysis /^cedited by A.W. Czanderna and David M. Hercules.
Campo 246:
Campo 260:
^aNew York :^bPlenum Press,^cc1991.
Campo 300:
^axvii, 469 p. :^bill. ;^c24 cm.
Campo 440:
0^aMethods of surface characterization ;^vv. 2
Campo 500:
^aReferences. Appendix. Index
Campo 505:
0 ^aOverview of ion spectroscopies for surface compositional analysis / A.W. Czanderna -- Surface structure and reaction studies by ion-solid collisions / Nicholas Winograd and Barbara J. Garrison -- Particle-induced desorption ionization techniques for organic mass spectrometry / Kenneth L. Busch -- Laser resonant and nonresonant photoionization of sputtered neutrals / Christopher H. Becker -- Rutherford backscattering and nuclear reaction analysis / L.C. Feldman -- Ion scattering spectroscopy / E. Taglauer -- Comparisons of SIMS, SNMS, ISS, RBS, AES, and XPS methods for surface compositional analysis / C.J. Powell, D.M. Hercules, and A.W. Czanderna.
Campo 650:
4^aESPECTROSCOPIA, EXITACION
Campo 650:
4^aSECONDARY ION MAS SPECTROMETRY
Campo 650:
0^aSecondary ion mass spectrometry.
Campo 650:
0^aSolids^xSurfaces^xAnalysis.
Campo 650:
4^aSOLIDS SURFACES ANALYSIS
Campo 650:
4^aSURFACE CHEMISTRY
Campo 650:
0^aSurface chemistry.
Campo 653:
^aSurfaces^aAnalysis
Campo 700:
1 ^aCzanderna, Alvin Warren,^d1930-
Campo 700:
1 ^aHercules, David M.
Proveniencia:
^aUnLitoral
Seleccionar y guardar el registro Haga click en el botón del carrito
Institucion:
Base de Datos MARC21 - OCLC
Dependencia:
BDUMARC21

Compartir este registro en Redes Sociales

Seleccionar y guardar el registro Haga click en el botón del carrito